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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

7 results · clear filters Sort: newest oldest name

  1. 53rd IEEE International Test Conference (ITC 2022)
    2022-09-25/30 · Anaheim, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e11ez2y
  2. IEEE International Test Conference (ITC)
    series, 6 events, 2017 to 2022
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    s126kht
  3. 52nd IEEE International Test Conference (ITC 2021)
    2021-10-10/15 · Anaheim, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e11ez10
  4. 51st International Test Conference (ITC 2020)
    2020-11-03/05 · Washington, D.C., United States · online
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyfz
  5. 50th (ITC 2019)
    2019-11-12/14 · Washington, D.C., United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hygw
  6. 49th IEEE International Test Conference (ITC 2018, ITC)
    2018-10-28 to 2018-11-01 · Phoenix, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyht
  7. 48th IEEE International Test Conference (ITC 2017, ITC)
    2017-10-30 to 2017-11-02 · Fort Worth, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyjr

As JSON: https://labs.confref.org/api/search?series=s126kht