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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

4 results · clear filters Sort: newest oldest name

  1. IEEE International Test Conference (ITC)
    series, 6 events, 2017 to 2022
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    s126kht
  2. 50th (ITC 2019)
    2019-11-12/14 · Washington, D.C., United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hygw
  3. 49th IEEE International Test Conference (ITC 2018, ITC)
    2018-10-28 to 2018-11-01 · Phoenix, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyht
  4. 48th IEEE International Test Conference (ITC 2017, ITC)
    2017-10-30 to 2017-11-02 · Fort Worth, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyjr

As JSON: https://labs.confref.org/api/search?series=s126kht&from=2010&to=2019