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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

3 results · clear filters Sort: newest oldest name

  1. International Conference on Microelectronic Test Structures (ICMTS)
    series, 8 events, 2008 to 2024
    Electrical engineering, electronic engineering, information engineering
    s126gy3
  2. 32nd IEEE International Conference on Microelectronic Test Structures (ICMTS 2019)
    2019-03-18/21 · Kitakyūshū, Japan
    Electrical engineering, electronic engineering, information engineering
    e123xkj
  3. 31st IEEE International Conference on Microelectronic Test Structures (ICMTS 2018)
    2018-03-19/22 · Austin, United States
    Electrical engineering, electronic engineering, information engineering
    e123xjm

As JSON: https://labs.confref.org/api/search?series=s126gy3&from=2010&to=2019