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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
11 results · clear filters Sort: newest oldest name
- International Test Conference (ITC)Computer and information sciencess122qw8
- 50th (ITC 2019)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hygw
- 49th IEEE International Test Conference (ITC 2018, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyht
- 48th IEEE International Test Conference (ITC 2017, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyjr
- 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016 (ITC 2016, ITC)Computer and information sciencese10hykp
- 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015 (ITC 2015, ITC)Computer and information sciencese10hymm
- 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014 (ITC 2014, ITC)Computer and information sciencese10hynj
- 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013 (ITC 2013, ITC)Computer and information sciencese10hypg
- 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 (ITC 2012, ITC)Computer and information sciencese10hyqe
- 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 (ITC 2011, ITC)Computer and information sciencese10hyrc
- 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010 (ITC 2010, ITC)Computer and information sciencese10hysa
As JSON: https://labs.confref.org/api/search?series=s122qw8&from=2010&to=2019