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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
11 results · clear filters Sort: newest oldest name
- International Test Conference (ITC)Computer and information sciencess10b0nx
- 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009 (ITC 2009, ITC)Computer and information sciencese10hyt8
- 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 (ITC 2008, ITC)Computer and information sciencese10hyv6
- 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007 (ITC 2007, ITC)Computer and information sciencese10hyw4
- 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006 (ITC 2006, ITC)Computer and information sciencese10hyx2
- Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005 (ITC 2005, ITC)Computer and information sciencese10hyy0
- Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA (ITC 2004, ITC)Computer and information sciencese10hyzy
- Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA (ITC 2003, ITC)Computer and information sciencese10hz0w
- Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 (ITC 2002, ITC)Computer and information sciencese10hz1t
- Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001 (ITC 2001, ITC)Computer and information sciencese10hz2r
- Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 (ITC 2000, ITC)Computer and information sciencese10hz3p
As JSON: https://labs.confref.org/api/search?series=s10b0nx&from=2000&to=2009