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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (DFT)Computer and information sciencess10bv8x
As JSON: https://labs.confref.org/api/search?kind=series&field=1.2&series=s10bv8x