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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
45 results · clear filters Sort: newest oldest name
- IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025Computer and information sciencese11ez5r
- International Test Conference (ITC)Computer and information sciencess122qw8
- IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024Computer and information sciencese11ez4t
- IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023Computer and information sciencese11ez3w
- 53rd IEEE International Test Conference (ITC 2022)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe11ez2y
- 52nd IEEE International Test Conference (ITC 2021)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe11ez10
- 51st International Test Conference (ITC 2020)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyfz
- 50th (ITC 2019)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hygw
- 49th IEEE International Test Conference (ITC 2018, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyht
- 48th IEEE International Test Conference (ITC 2017, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyjr
- 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016 (ITC 2016, ITC)Computer and information sciencese10hykp
- 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015 (ITC 2015, ITC)Computer and information sciencese10hymm
- 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014 (ITC 2014, ITC)Computer and information sciencese10hynj
- 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013 (ITC 2013, ITC)Computer and information sciencese10hypg
- 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 (ITC 2012, ITC)Computer and information sciencese10hyqe
- 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 (ITC 2011, ITC)Computer and information sciencese10hyrc
- 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010 (ITC 2010, ITC)Computer and information sciencese10hysa
- 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009 (ITC 2009, ITC)Computer and information sciencese10hyt8
- 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 (ITC 2008, ITC)Computer and information sciencese10hyv6
- 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007 (ITC 2007, ITC)Computer and information sciencese10hyw4
- 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006 (ITC 2006, ITC)Computer and information sciencese10hyx2
- Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005 (ITC 2005, ITC)Computer and information sciencese10hyy0
- Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA (ITC 2004, ITC)Computer and information sciencese10hyzy
- Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA (ITC 2003, ITC)Computer and information sciencese10hz0w
- Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 (ITC 2002, ITC)Computer and information sciencese10hz1t
As JSON: https://labs.confref.org/api/search?field=1&series=s122qw8