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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- IEEE International Test Conference (ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineerings126kht
As JSON: https://labs.confref.org/api/search?kind=series&discipline=Q43035&series=s126kht