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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

38 results · clear filters Sort: newest oldest name

  1. International Test Conference (ITC)
    series, 39 events, 1981 to 2020
    Computer and information sciences
    s10b0nx
  2. 49th IEEE International Test Conference (ITC 2018, ITC)
    2018-10-28 to 2018-11-01 · Phoenix, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyht
  3. 48th IEEE International Test Conference (ITC 2017, ITC)
    2017-10-30 to 2017-11-02 · Fort Worth, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyjr
  4. 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016 (ITC 2016, ITC)
    2016-11-15/17 · Fort Worth, United States
    Computer and information sciences
    e10hykp
  5. 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015 (ITC 2015, ITC)
    2015-10-06/08 · Anaheim, United States
    Computer and information sciences
    e10hymm
  6. 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014 (ITC 2014, ITC)
    2014-10-20/23 · Seattle, United States
    Computer and information sciences
    e10hynj
  7. 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013 (ITC 2013, ITC)
    2013-09-06/13 · Anaheim, United States
    Computer and information sciences
    e10hypg
  8. 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 (ITC 2012, ITC)
    2012-11-05/08 · Anaheim, United States
    Computer and information sciences
    e10hyqe
  9. 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 (ITC 2011, ITC)
    2011-09-20/22 · Anaheim, United States
    Computer and information sciences
    e10hyrc
  10. 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010 (ITC 2010, ITC)
    2010-11-02/04 · Austin, United States
    Computer and information sciences
    e10hysa
  11. 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009 (ITC 2009, ITC)
    2009-11-01/06 · Austin, United States
    Computer and information sciences
    e10hyt8
  12. 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 (ITC 2008, ITC)
    2008-10-26/31 · Santa Clara, United States
    Computer and information sciences
    e10hyv6
  13. 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007 (ITC 2007, ITC)
    2007-10-21/26 · Santa Clara, United States
    Computer and information sciences
    e10hyw4
  14. 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006 (ITC 2006, ITC)
    2006-10-22/27 · Santa Clara, United States
    Computer and information sciences
    e10hyx2
  15. Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005 (ITC 2005, ITC)
    2005-11-08/10 · Austin, United States
    Computer and information sciences
    e10hyy0
  16. Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA (ITC 2004, ITC)
    2004-10-26/28 · Charlotte, United States
    Computer and information sciences
    e10hyzy
  17. Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA (ITC 2003, ITC)
    2003-09-28 to 2003-10-03 · Charlotte, United States
    Computer and information sciences
    e10hz0w
  18. Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 (ITC 2002, ITC)
    2002-10-07/10 · Baltimore, United States
    Computer and information sciences
    e10hz1t
  19. Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001 (ITC 2001, ITC)
    2001-10-30 to 2001-11-01 · Baltimore, United States
    Computer and information sciences
    e10hz2r
  20. Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 (ITC 2000, ITC)
    2000-10-01 · Atlantic City, United States
    Computer and information sciences
    e10hz3p
  21. Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999 (ITC 1999, ITC)
    1999-09-27/30 · Atlantic City, United States
    Computer and information sciences
    e10hz4m
  22. Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998 (ITC 1998, ITC)
    1998-10-18/22 · Washington, D.C., United States
    Computer and information sciences
    e10hz5j
  23. Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997 (ITC 1997, ITC)
    1997-11-03/05 · Washington, D.C., United States
    Computer and information sciences
    e10hz6g
  24. Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996 (ITC 1996, ITC)
    1996-10-20/25 · Washington, D.C., United States
    Computer and information sciences
    e10hz7e
  25. Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995 (ITC 1995, ITC)
    1995-10-21/25 · Washington, D.C., United States
    Computer and information sciences
    e10hz8c

As JSON: https://labs.confref.org/api/search?discipline=Q21198&series=s10b0nx