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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

28 results · clear filters Sort: newest oldest name

  1. 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995 (DFT)
    1995-11-13/15 · Lafayette, United States
    Computer and information sciences
    e10z9vz
  2. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings (DFT)
    1994-10-17/19 · Montreal, Canada
    Computer and information sciences
    e10z9t1
  3. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings (DFT)
    1993-10-27/29 · Venice, Italy
    Computer and information sciences
    e10z9s3

As JSON: https://labs.confref.org/api/search?discipline=Q21198&series=s10bv8x&page=2