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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- 49th IEEE International Test Conference (ITC 2018, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyht
- 48th IEEE International Test Conference (ITC 2017, ITC)Computer and information sciencesElectrical engineering, electronic engineering, information engineeringe10hyjr
As JSON: https://labs.confref.org/api/search?discipline=Q21198&series=s126kht&mode=OfflineEventAttendanceMode