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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers (VDAT 2018, VDAT)Computer and information sciencese10et08
- 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018 (VTS 2018, VTS)Computer and information sciencese10ebq8
- VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (VDAT 2017, VDAT)Computer and information sciencese10et16
- 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017 (VTS 2017, VTS)Computer and information sciencese10ebr6
- VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers (VDAT 2013, VDAT)Computer and information sciencese10et24
As JSON: https://labs.confref.org/api/search?discipline=Q1003030