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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

2 results · clear filters Sort: newest oldest name

  1. 31st IEEE International Conference on Microelectronic Test Structures (ICMTS 2018)
    2018-03-19/22 · Austin, United States
    Electrical engineering, electronic engineering, information engineering
    e123xjm
  2. IEEE International Conference on Microelectronic Test Structures 2009 (ICMTS 2009)
    2009-03-30 to 2009-04-02 · Oxnard, United States
    Electrical engineering, electronic engineering, information engineering
    e123xgr

As JSON: https://labs.confref.org/api/search?series=s126gy3&country=US