Betaconfref labs: services in development; they can change or be unavailable. The project site is www.confref.org.

Search Beta

Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

44 results · clear filters Sort: newest oldest name

  1. IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025
    2025 · San Diego, United States
    Computer and information sciences
    e11ez5r
  2. IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024
    2024 · San Diego, United States
    Computer and information sciences
    e11ez4t
  3. IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023
    2023 · Anaheim, United States
    Computer and information sciences
    e11ez3w
  4. 53rd IEEE International Test Conference (ITC 2022)
    2022-09-25/30 · Anaheim, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e11ez2y
  5. 52nd IEEE International Test Conference (ITC 2021)
    2021-10-10/15 · Anaheim, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e11ez10
  6. 51st International Test Conference (ITC 2020)
    2020-11-03/05 · Washington, D.C., United States · online
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyfz
  7. 50th (ITC 2019)
    2019-11-12/14 · Washington, D.C., United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hygw
  8. 49th IEEE International Test Conference (ITC 2018, ITC)
    2018-10-28 to 2018-11-01 · Phoenix, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyht
  9. 48th IEEE International Test Conference (ITC 2017, ITC)
    2017-10-30 to 2017-11-02 · Fort Worth, United States
    Computer and information sciencesElectrical engineering, electronic engineering, information engineering
    e10hyjr
  10. 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016 (ITC 2016, ITC)
    2016-11-15/17 · Fort Worth, United States
    Computer and information sciences
    e10hykp
  11. 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015 (ITC 2015, ITC)
    2015-10-06/08 · Anaheim, United States
    Computer and information sciences
    e10hymm
  12. 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014 (ITC 2014, ITC)
    2014-10-20/23 · Seattle, United States
    Computer and information sciences
    e10hynj
  13. 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013 (ITC 2013, ITC)
    2013-09-06/13 · Anaheim, United States
    Computer and information sciences
    e10hypg
  14. 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 (ITC 2012, ITC)
    2012-11-05/08 · Anaheim, United States
    Computer and information sciences
    e10hyqe
  15. 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 (ITC 2011, ITC)
    2011-09-20/22 · Anaheim, United States
    Computer and information sciences
    e10hyrc
  16. 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010 (ITC 2010, ITC)
    2010-11-02/04 · Austin, United States
    Computer and information sciences
    e10hysa
  17. 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009 (ITC 2009, ITC)
    2009-11-01/06 · Austin, United States
    Computer and information sciences
    e10hyt8
  18. 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 (ITC 2008, ITC)
    2008-10-26/31 · Santa Clara, United States
    Computer and information sciences
    e10hyv6
  19. 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007 (ITC 2007, ITC)
    2007-10-21/26 · Santa Clara, United States
    Computer and information sciences
    e10hyw4
  20. 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006 (ITC 2006, ITC)
    2006-10-22/27 · Santa Clara, United States
    Computer and information sciences
    e10hyx2
  21. Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005 (ITC 2005, ITC)
    2005-11-08/10 · Austin, United States
    Computer and information sciences
    e10hyy0
  22. Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA (ITC 2004, ITC)
    2004-10-26/28 · Charlotte, United States
    Computer and information sciences
    e10hyzy
  23. Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA (ITC 2003, ITC)
    2003-09-28 to 2003-10-03 · Charlotte, United States
    Computer and information sciences
    e10hz0w
  24. Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 (ITC 2002, ITC)
    2002-10-07/10 · Baltimore, United States
    Computer and information sciences
    e10hz1t
  25. Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001 (ITC 2001, ITC)
    2001-10-30 to 2001-11-01 · Baltimore, United States
    Computer and information sciences
    e10hz2r

As JSON: https://labs.confref.org/api/search?series=s122qw8&country=US