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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2008)Computer and information sciencese124d15
As JSON: https://labs.confref.org/api/search?discipline=Q173212&country=SG&mode=OfflineEventAttendanceMode