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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019 (DFT)Computer and information sciencese10zafq
As JSON: https://labs.confref.org/api/search?field=1&series=s10bv8x&country=NL