Search Beta
Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
1 result · clear filters Sort: newest oldest name
- Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia (DELTA)Computer and information sciencese10z4jp
As JSON: https://labs.confref.org/api/search?series=s10br48&country=MY