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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

2 results · clear filters Sort: newest oldest name

  1. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010 (DFT)
    2010-10-06/08 · Kyoto, Japan
    Computer and information sciences
    e10za85
  2. 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings (DFT)
    2000-10-25/27 · Yamanashi, Japan
    Computer and information sciences
    e10z9zq

As JSON: https://labs.confref.org/api/search?field=1.2&series=s10bv8x&country=JP