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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

3 results · clear filters Sort: newest oldest name

  1. TAIC PART 2017 : 12th Workshop on Testing: Academia-Industry Collaboration, Practice and Research Techniques (TAIC PART 2017)
    2017-03-13/18 · Tokyo, Japan
    MathematicsComputer and information sciencesEconomics and business
    e127d6n
  2. ITEQS 2017 : 1st International Workshop on Testing Extra-Functional Properties and Quality Characteristics of Software Systems (ITEQS 2017)
    2017-03-12/19 · Tokyo, Japan
    MathematicsComputer and information sciences
    e124mtb
  3. 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017
    2017 · Tokyo, Japan
    Computer and information sciences
    e11apyp

As JSON: https://labs.confref.org/api/search?field=1.2&discipline=Q188522&country=JP