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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- International Conference on Microelectronic Test Structures 2023 (ICMTS 2023)Electrical engineering, electronic engineering, information engineeringe12c8b6
- 32nd IEEE International Conference on Microelectronic Test Structures (ICMTS 2019)Electrical engineering, electronic engineering, information engineeringe123xkj
As JSON: https://labs.confref.org/api/search?field=2&discipline=Q175403&country=JP