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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- Proceedings of the 2008 Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies, WREFT '08, Ischia, Italy, May 5-7, 2008Computer and information sciencese10vj2h
As JSON: https://labs.confref.org/api/search?field=1&series=s123wd0&country=IT