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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.

2 results · clear filters Sort: newest oldest name

  1. 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. (DFT)
    2007-09-26/28 · Rome, Italy
    Computer and information sciences
    e10za69
  2. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings (DFT)
    1993-10-27/29 · Venice, Italy
    Computer and information sciences
    e10z9s3

As JSON: https://labs.confref.org/api/search?discipline=Q21198&series=s10bv8x&country=IT