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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008 (DELTA)Computer and information sciencese10z4km
As JSON: https://labs.confref.org/api/search?kind=event&series=s10br48&country=HK