Search Beta
Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
2 results · clear filters Sort: newest oldest name
- International Conference on Microelectronic Test Structures 2024 (ICMTS 2024)Electrical engineering, electronic engineering, information engineeringe12c8a8
- IEEE International Conference on Microelectronic Test Structures 2008 (ICMTS 2008)Electrical engineering, electronic engineering, information engineeringe123xfv
As JSON: https://labs.confref.org/api/search?series=s126gy3&country=GB