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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017 (DFT)Computer and information sciencese10zadv
As JSON: https://labs.confref.org/api/search?discipline=Q21198&series=s10bv8x&country=GB