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Series and events of the confref identifiers. Look up an identifier (dblp key, Wikidata, GND, DOI of the proceedings) through the API.
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- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2025, Barcelona, Spain, October 21-23, 2025Computer and information sciencese10zana
As JSON: https://labs.confref.org/api/search?field=1&series=s10bv8x&country=ES