{
 "query": {
  "series": [
   "s126gy3"
  ],
  "mode": "OnlineEventAttendanceMode",
  "page": 1
 },
 "total": 2,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "e123xne",
   "iri": "https://id.confref.org/event/e123xne",
   "kind": "event",
   "label": "International Conference on Microelectronic Test Structures 2022",
   "acronyms": [
    "ICMTS 2022"
   ],
   "fields": [
    "2.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q175403"
   ],
   "year": 2022,
   "start": "2022-03-21",
   "end": "2022-03-24",
   "series": [
    "s126gy3"
   ],
   "place": null,
   "country": null,
   "lat": null,
   "lon": null,
   "mode": "online"
  },
  {
   "id": "e123xmg",
   "iri": "https://id.confref.org/event/e123xmg",
   "kind": "event",
   "label": "33rd IEEE International Conference on Microelectronic Test Structures",
   "acronyms": [
    "ICMTS 2020"
   ],
   "fields": [
    "2.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q175403"
   ],
   "year": 2020,
   "start": "2020-05-04",
   "end": "2020-05-17",
   "series": [
    "s126gy3"
   ],
   "place": null,
   "country": null,
   "lat": null,
   "lon": null,
   "mode": "online"
  }
 ]
}