{
 "query": {
  "series": [
   "s10b6qk"
  ],
  "from": 2010,
  "to": 2019,
  "page": 1
 },
 "total": 11,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "s10b6qk",
   "iri": "https://id.confref.org/series/s10b6qk",
   "kind": "series",
   "label": "Asian Test Symposium (ATS)",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "first": 1995,
   "last": 2025,
   "events": 31
  },
  {
   "id": "e10ffvt",
   "iri": "https://id.confref.org/event/e10ffvt",
   "kind": "event",
   "label": "28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019",
   "acronyms": [
    "Asian Test Symposium 2019"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [],
   "year": 2019,
   "start": "2019-12-10",
   "end": "2019-12-13",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q1348",
   "country": "IN",
   "lat": 22.5675,
   "lon": 88.37,
   "mode": null
  },
  {
   "id": "e10e3w6",
   "iri": "https://id.confref.org/event/e10e3w6",
   "kind": "event",
   "label": "27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018",
   "acronyms": [
    "ATS 2018",
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2018,
   "start": "2018-10-15",
   "end": "2018-10-18",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q185684",
   "country": "CN",
   "lat": 31.8639,
   "lon": 117.2808,
   "mode": null
  },
  {
   "id": "e10rvm9",
   "iri": "https://id.confref.org/event/e10rvm9",
   "kind": "event",
   "label": "26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2017,
   "start": "2017-11-27",
   "end": "2017-11-30",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q1867",
   "country": "TW",
   "lat": 25.0375,
   "lon": 121.5625,
   "mode": null
  },
  {
   "id": "e10rvkb",
   "iri": "https://id.confref.org/event/e10rvkb",
   "kind": "event",
   "label": "25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2016,
   "start": "2016-11-21",
   "end": "2016-11-24",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q34664",
   "country": "JP",
   "lat": 34.3852,
   "lon": 132.4553,
   "mode": null
  },
  {
   "id": "e10rvjd",
   "iri": "https://id.confref.org/event/e10rvjd",
   "kind": "event",
   "label": "24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2015,
   "start": "2015-11-22",
   "end": "2015-11-25",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q1156",
   "country": "IN",
   "lat": 19.0758,
   "lon": 72.8775,
   "mode": null
  },
  {
   "id": "e10rvhf",
   "iri": "https://id.confref.org/event/e10rvhf",
   "kind": "event",
   "label": "23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2014,
   "start": "2014-11-16",
   "end": "2014-11-19",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q4970",
   "country": "CN",
   "lat": 30.25,
   "lon": 120.1675,
   "mode": null
  },
  {
   "id": "e10rvgh",
   "iri": "https://id.confref.org/event/e10rvgh",
   "kind": "event",
   "label": "22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2013,
   "start": "2013-11-18",
   "end": "2013-11-21",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q237258",
   "country": "TW",
   "lat": 24.75,
   "lon": 121.75,
   "mode": null
  },
  {
   "id": "e10ffwr",
   "iri": "https://id.confref.org/event/e10ffwr",
   "kind": "event",
   "label": "21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012",
   "acronyms": [
    "ATS",
    "Asian Test Symposium 2012"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2012,
   "start": "2012-11-19",
   "end": "2012-11-22",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q179691",
   "country": "JP",
   "lat": 37.9162,
   "lon": 139.0364,
   "mode": null
  },
  {
   "id": "e10rvfm",
   "iri": "https://id.confref.org/event/e10rvfm",
   "kind": "event",
   "label": "Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2011,
   "start": "2011-11-20",
   "end": "2011-11-23",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q987",
   "country": "IN",
   "lat": 28.6139,
   "lon": 77.2089,
   "mode": null
  },
  {
   "id": "e10rvep",
   "iri": "https://id.confref.org/event/e10rvep",
   "kind": "event",
   "label": "Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China",
   "acronyms": [
    "ATS"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2010,
   "start": "2010-12-01",
   "end": "2010-12-04",
   "series": [
    "s10b6qk"
   ],
   "place": "http://www.wikidata.org/entity/Q8686",
   "country": "CN",
   "lat": 31.2325,
   "lon": 121.4692,
   "mode": null
  }
 ]
}