{
 "query": {
  "series": [
   "s10bv8x"
  ],
  "from": 2000,
  "to": 2009,
  "page": 1
 },
 "total": 11,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "s10bv8x",
   "iri": "https://id.confref.org/series/s10bv8x",
   "kind": "series",
   "label": "IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "first": 1993,
   "last": 2025,
   "events": 33
  },
  {
   "id": "e10g51p",
   "iri": "https://id.confref.org/event/e10g51p",
   "kind": "event",
   "label": "24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009",
   "acronyms": [
    "DFT 2009",
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198",
    "http://www.wikidata.org/entity/Q876049"
   ],
   "year": 2009,
   "start": "2009-10-07",
   "end": "2009-10-09",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q1297",
   "country": "US",
   "lat": 41.8819,
   "lon": -87.6278,
   "mode": null
  },
  {
   "id": "e10za77",
   "iri": "https://id.confref.org/event/e10za77",
   "kind": "event",
   "label": "23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2008,
   "start": "2008-10-01",
   "end": "2008-10-03",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q100",
   "country": "US",
   "lat": 42.3603,
   "lon": -71.0578,
   "mode": null
  },
  {
   "id": "e10za69",
   "iri": "https://id.confref.org/event/e10za69",
   "kind": "event",
   "label": "22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy.",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2007,
   "start": "2007-09-26",
   "end": "2007-09-28",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q220",
   "country": "IT",
   "lat": 41.8931,
   "lon": 12.4828,
   "mode": null
  },
  {
   "id": "e10za5b",
   "iri": "https://id.confref.org/event/e10za5b",
   "kind": "event",
   "label": "21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2006,
   "start": "2006-10-04",
   "end": "2006-10-06",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q17943",
   "country": "US",
   "lat": 32.705,
   "lon": -97.1228,
   "mode": null
  },
  {
   "id": "e10za4d",
   "iri": "https://id.confref.org/event/e10za4d",
   "kind": "event",
   "label": "20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2005,
   "start": "2005-10-03",
   "end": "2005-10-05",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q487315",
   "country": "US",
   "lat": 36.6002,
   "lon": -121.8947,
   "mode": null
  },
  {
   "id": "e10za3f",
   "iri": "https://id.confref.org/event/e10za3f",
   "kind": "event",
   "label": "19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2004,
   "start": "2004-10-10",
   "end": "2004-10-13",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q39984",
   "country": "FR",
   "lat": 43.5525,
   "lon": 7.0214,
   "mode": null
  },
  {
   "id": "e10za2h",
   "iri": "https://id.confref.org/event/e10za2h",
   "kind": "event",
   "label": "18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2003,
   "start": "2003-11-03",
   "end": "2003-11-05",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q100",
   "country": "US",
   "lat": 42.3603,
   "lon": -71.0578,
   "mode": null
  },
  {
   "id": "e10za1k",
   "iri": "https://id.confref.org/event/e10za1k",
   "kind": "event",
   "label": "17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2002,
   "start": "2002-01-01",
   "end": "2002-01-01",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q24639",
   "country": "CA",
   "lat": 49.2608,
   "lon": -123.1139,
   "mode": null
  },
  {
   "id": "e10za0n",
   "iri": "https://id.confref.org/event/e10za0n",
   "kind": "event",
   "label": "16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2001,
   "start": "2001-10-24",
   "end": "2001-10-26",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q62",
   "country": "US",
   "lat": 37.775,
   "lon": -122.4194,
   "mode": null
  },
  {
   "id": "e10z9zq",
   "iri": "https://id.confref.org/event/e10z9zq",
   "kind": "event",
   "label": "15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings",
   "acronyms": [
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2000,
   "start": "2000-10-25",
   "end": "2000-10-27",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q840610",
   "country": "JP",
   "lat": 35.6934,
   "lon": 138.6869,
   "mode": null
  }
 ]
}