{
 "query": {
  "series": [
   "s12q029"
  ],
  "from": 1990,
  "to": 1999,
  "page": 1
 },
 "total": 11,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "s12q029",
   "iri": "https://id.confref.org/series/s12q029",
   "kind": "series",
   "label": "International Test Conference (ITC)",
   "acronyms": [],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "first": 1981,
   "last": 2018,
   "events": 37
  },
  {
   "id": "e10hz4m",
   "iri": "https://id.confref.org/event/e10hz4m",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999",
   "acronyms": [
    "ITC 1999",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1999,
   "start": "1999-09-27",
   "end": "1999-09-30",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q139564",
   "country": "US",
   "lat": 39.3625,
   "lon": -74.425,
   "mode": null
  },
  {
   "id": "e10hz5j",
   "iri": "https://id.confref.org/event/e10hz5j",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998",
   "acronyms": [
    "ITC 1998",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1998,
   "start": "1998-10-18",
   "end": "1998-10-22",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  },
  {
   "id": "e10hz6g",
   "iri": "https://id.confref.org/event/e10hz6g",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997",
   "acronyms": [
    "ITC 1997",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1997,
   "start": "1997-11-03",
   "end": "1997-11-05",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  },
  {
   "id": "e10hz7e",
   "iri": "https://id.confref.org/event/e10hz7e",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996",
   "acronyms": [
    "ITC 1996",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1996,
   "start": "1996-10-20",
   "end": "1996-10-25",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  },
  {
   "id": "e10hz8c",
   "iri": "https://id.confref.org/event/e10hz8c",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995",
   "acronyms": [
    "ITC 1995",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1995,
   "start": "1995-10-21",
   "end": "1995-10-25",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  },
  {
   "id": "e10hz9a",
   "iri": "https://id.confref.org/event/e10hz9a",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994",
   "acronyms": [
    "ITC 1994",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1994,
   "start": "1994-10-02",
   "end": "1994-10-06",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  },
  {
   "id": "e10hza8",
   "iri": "https://id.confref.org/event/e10hza8",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993",
   "acronyms": [
    "ITC 1993",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1993,
   "start": "1993-10-17",
   "end": "1993-10-21",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q5092",
   "country": "US",
   "lat": 39.2864,
   "lon": -76.615,
   "mode": null
  },
  {
   "id": "e10hzb6",
   "iri": "https://id.confref.org/event/e10hzb6",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992",
   "acronyms": [
    "ITC 1992",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1992,
   "start": "1992-09-20",
   "end": "1992-09-24",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q5092",
   "country": "US",
   "lat": 39.2864,
   "lon": -76.615,
   "mode": null
  },
  {
   "id": "e10hzc4",
   "iri": "https://id.confref.org/event/e10hzc4",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991",
   "acronyms": [
    "ITC 1991",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1991,
   "start": "1991-10-26",
   "end": "1991-10-30",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q23197",
   "country": "US",
   "lat": 36.1622,
   "lon": -86.7744,
   "mode": null
  },
  {
   "id": "e10hzd2",
   "iri": "https://id.confref.org/event/e10hzd2",
   "kind": "event",
   "label": "Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990",
   "acronyms": [
    "ITC 1990",
    "ITC"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 1990,
   "start": "1990-09-10",
   "end": "1990-09-14",
   "series": [
    "s10b0nx",
    "s122qw8",
    "s12q029"
   ],
   "place": "http://www.wikidata.org/entity/Q61",
   "country": "US",
   "lat": 38.895,
   "lon": -77.0367,
   "mode": null
  }
 ]
}