{
 "query": {
  "field": [
   "1"
  ],
  "discipline": [
   "Q876049"
  ],
  "series": [
   "s10bv8x"
  ],
  "page": 1
 },
 "total": 4,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "e10g4zt",
   "iri": "https://id.confref.org/event/e10g4zt",
   "kind": "event",
   "label": "2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014",
   "acronyms": [
    "DFT 2014",
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198",
    "http://www.wikidata.org/entity/Q876049"
   ],
   "year": 2014,
   "start": "2014-10-01",
   "end": "2014-10-03",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q727",
   "country": null,
   "lat": 52.3667,
   "lon": 4.8833,
   "mode": null
  },
  {
   "id": "e10g50r",
   "iri": "https://id.confref.org/event/e10g50r",
   "kind": "event",
   "label": "2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012",
   "acronyms": [
    "DFT 2012",
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198",
    "http://www.wikidata.org/entity/Q876049"
   ],
   "year": 2012,
   "start": "2012-10-03",
   "end": "2012-10-05",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q16559",
   "country": "US",
   "lat": 30.3,
   "lon": -97.7333,
   "mode": null
  },
  {
   "id": "e10g51p",
   "iri": "https://id.confref.org/event/e10g51p",
   "kind": "event",
   "label": "24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009",
   "acronyms": [
    "DFT 2009",
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198",
    "http://www.wikidata.org/entity/Q876049"
   ],
   "year": 2009,
   "start": "2009-10-07",
   "end": "2009-10-09",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q1297",
   "country": "US",
   "lat": 41.8819,
   "lon": -87.6278,
   "mode": null
  },
  {
   "id": "e10g52m",
   "iri": "https://id.confref.org/event/e10g52m",
   "kind": "event",
   "label": "1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996",
   "acronyms": [
    "DFT 1996",
    "DFT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198",
    "http://www.wikidata.org/entity/Q876049"
   ],
   "year": 1996,
   "start": "1996-11-06",
   "end": "1996-11-08",
   "series": [
    "s10bv8x"
   ],
   "place": "http://www.wikidata.org/entity/Q100",
   "country": "US",
   "lat": 42.3603,
   "lon": -71.0578,
   "mode": null
  }
 ]
}