{
 "query": {
  "series": [
   "s10bp90"
  ],
  "country": [
   "TW"
  ],
  "page": 1
 },
 "total": 2,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "e11kgf8",
   "iri": "https://id.confref.org/event/e11kgf8",
   "kind": "event",
   "label": "14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan",
   "acronyms": [
    "MTDT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2006,
   "start": "2006-08-02",
   "end": "2006-08-04",
   "series": [
    "s10bp90"
   ],
   "place": "http://www.wikidata.org/entity/Q1867",
   "country": "TW",
   "lat": 25.0375,
   "lon": 121.5625,
   "mode": null
  },
  {
   "id": "e11kgea",
   "iri": "https://id.confref.org/event/e11kgea",
   "kind": "event",
   "label": "13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan",
   "acronyms": [
    "MTDT"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2005,
   "start": "2005-08-03",
   "end": "2005-08-05",
   "series": [
    "s10bp90"
   ],
   "place": "http://www.wikidata.org/entity/Q1867",
   "country": "TW",
   "lat": 25.0375,
   "lon": 121.5625,
   "mode": null
  }
 ]
}