{
 "query": {
  "kind": "event",
  "series": [
   "s10br48"
  ],
  "country": [
   "MY"
  ],
  "page": 1
 },
 "total": 1,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "e10z4jp",
   "iri": "https://id.confref.org/event/e10z4jp",
   "kind": "event",
   "label": "Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia",
   "acronyms": [
    "DELTA"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q21198"
   ],
   "year": 2006,
   "start": "2006-01-17",
   "end": "2006-01-19",
   "series": [
    "s10br48"
   ],
   "place": "http://www.wikidata.org/entity/Q1865",
   "country": "MY",
   "lat": 3.1478,
   "lon": 101.6953,
   "mode": null
  }
 ]
}