{
 "query": {
  "kind": "event",
  "series": [
   "s10d1af"
  ],
  "country": [
   "DE"
  ],
  "page": 1
 },
 "total": 1,
 "sort": "newest",
 "page": 1,
 "per_page": 25,
 "results": [
  {
   "id": "e10h8yp",
   "iri": "https://id.confref.org/event/e10h8yp",
   "kind": "event",
   "label": "Embedded Systems: Design, Analysis and Verification - 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013",
   "acronyms": [
    "IESS 2013"
   ],
   "fields": [
    "1.2"
   ],
   "disciplines": [
    "http://www.wikidata.org/entity/Q193040"
   ],
   "year": 2013,
   "start": "2013-06-17",
   "end": "2013-06-19",
   "series": [
    "s10d1af"
   ],
   "place": "http://www.wikidata.org/entity/Q2971",
   "country": "DE",
   "lat": 51.7167,
   "lon": 8.7667,
   "mode": null
  }
 ]
}